EO Systems

We provide a wide range of customized Electro-optic (EO) System solutions for test and evaluation of Laser Sensors, Laser Seekers, Laser Target Designators and Laser Range Finders for both serviceability checks and comprehensive characterization. We also offer EO test systems for serviceability checks of Laser Guided Munitions and single-colour and two-colour Infrared Guided Missiles. EO Test Systems intended for serviceability checks are battery operated field portable systems. EO Test Systems intended for comprehensive characterization are bench top units. Both manual control and PC interface options can be offered for parametric control. We also customize system packaging as per the requirements of the user.


  • Programmable Pulsed Laser Sources for Testing Laser Sensors and Seekers

      • Programmable Pulsed Laser Sources for Testing Laser Sensors

        Programmable Pulsed Laser Source is used to simulate the threats from laser target designators and range finders. The system can be operated from different standoff ranges. It generates different power densities, the spot sizes and the probable PRF codes likely to be encountered by an LWS system. It is a complete solution package for the testing of an LWS system.

        Specifications
        • Laser Wavelength
        • :
        • 905/1064/1550 nm
        • Pulse Width
        • :
        • 10 ns to 100 ns (Other pulse widths can be offered on request)
        • Laser Beam Spot Size
        • :
        • 50 mm to 80 mm
        • Programmable Pulse Repetition Frequency

        For detailed specifications or customized requirements, contact info@tekxplore.com

      • Programmable Pulsed Laser Sources for Testing Laser Seekers

        The seeker systems used in Laser guided weapons, must endure rigorous testing to ensure proper functionality. The Laser Seeker Test System supports both lab as well as field testing of seeker heads of laser guided munitions. It is available in two configurations, hand-held and bench-top models

        Hand-held version

        The system simulates the return signatures of a laser target in terms of laser wavelength, PRF, pulse width and power density. It can be used for GO/ NO-GO field testing (O-level) of the seeker head.

      • Specifications
        • Laser Wavelength      : 1060-1070 nm/1540-1550 nm
        • Programmable Pulse Repetition Frequency
        • Red laser for initial alignment with seeker (Optional)

        For detailed specifications or customized requirements, contact info@tekxplore.com

        Bench-top version

        The system is a collimated spatially dynamic laser source that is used to check the comprehensive performance of the laser seeker system. It generates a collimated laser spot over-spilling the seeker and is used to check the performance of the seeker in terms of PRF code matching, power sensitivity, pulse width sensitivity and angular performance. It can be configured for connection to a master computer for remote operation.

        The system is modular in design and can be delivered in various versions with different collimated spot sizes and interface requirements depending upon the user requirement.

        For detailed specifications or customized requirements, contact info@tekxplore.com

LASSEK-1064
  • Laser Range Finder and Target Designator Test System

    These system measures Pulse Energy and Pulse Repetition Frequency (PRF). The system can be customized as per user requirements to measure the parameters as required by the user.

    Specifications
    • PRF Measuring Range
    • :
    • single shot to 50 Hz
    • PRF Resolution
    • :
    • +/- 1.0 µs in time interval
    • Operating Wavelength
    • :
    • 1064 nm / 1540 nm
    • PC interface through RS232/RS422
  • Hand Held Mid-IR (3 – 5 micron) Infrared Source

    For detailed specifications or customized requirements, contact info@tekxplore.com

  • Portable Far-IR (8 – 12 micron) Infrared Source

    For detailed specifications or customized requirements,contact info@tekxplore.com

  • Programmable Infrared Source

    For detailed specifications or customized requirements, contact info@tekxplore.com